Automated metrology for metalens characterization, from coupon to wafer scale.
Closed-loop test stations that measure point-spread function, MTF, throughput and uniformity across visible and infrared bands. Built for production QC and design iteration.
Our testers characterise metalenses across visible and infrared bands, from a manual bench for R&D to fully automated wafer-level systems for production, with the repeatability a line needs.
Beyond our standard platforms, we develop optical test systems around your production testing needs — tailored to your metasurface, metalens, and flat-optics products. Similar characterisation principles apply across flat optics, so each system can be matched to the wavelengths, geometries, and part handling your process requires.
Every system is engineered, assembled, and integrated to industrial standards — covering not just the optics but the full machine build: ergonomic station heights for safe operator access, emergency-stop buttons on each side, guarding free of sharp edges, and a tested enclosure and automation.




Configured to your part, wavelengths and handling.
Built for repeatable, gauge-capable measurement.
Characterised across the visible, near-infrared and short-wave infrared bands.
One workflow from coupons up to full wafers.
Manual, semi-automatic or fully automated handling.

Tell us what you need to measure and we will match a platform.
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Singapore (HQ)
Metaoptics Technologies Pte Ltd. 81 Ayer Rajah Crescent, #01-45 Singapore 139967
United States
Metaoptics Inc. (USA); 1 Ferry Building, Suite 201 San Francisco, CA 94111